The event is going to be organized at Keble College, Oxford University, UK. This event ha called for submitting papers from around the globe on topics related to topics. A few of them are accepted and those are going to be discussed at the conference. Some of their names are “Building a Classification System for Failed Test Reports: Industrial Experience”, “Testing Acoustic Scene Classifiers using Metamorphic Relations”, “A Multi-Agent Systems Approach to Test Generation for Simulation-based Autonomous Vehicle Verification”, “A Multi-Agent Systems Approach to Test Generation for Simulation-based Autonomous Vehicle Verification”, “Coverage based testing for V&V and Safety Assurance of Self-driving Autonomous Vehicles: A Systematic Literature Review” and many more. This event is sponsored by the IEEE Computer Society. For more information, you can visit the site.
The Second IEEE International Conference On Artificial Intelligence Testing
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